How to Apply the Fundamental Parameters Method to the Quantitative X-ray Fluorescence Analysis of Geological Materials

Richard Rousseau^1,

¹Les logiciels R. Rousseau Inc., Cantley, Canada

Cite this paper

Richard Rousseau. How to Apply the Fundamental Parameters Method to the Quantitative X-ray Fluorescence Analysis of Geological Materials. Journal of Geosciences and Geomatics. 2013; 1(1):1-7. doi: 10.12691/JGG-1-1-1

Abstract

The X-ray fluorescence (XRF) analysis of geological materials requires a robust analytical method because a large variety of elements to determine can be present in each sample and the concentration range of each one can be very large. In order to extract the maximum accuracy from the measured XRF intensities, a Fundamental Parameters (FP) method is proposed, but an adapted one to such an analytical context. The proposed adapted FP method consists of an appropriate sample preparation, a unique concentration calculation method and calibration procedure. It includes also a management of volatile components.

Keywords

XRF spectrometry, XRF analysis, matrix effect correction, Sherman equation, Fundamental Parameters, Fundamental algorithm, matrix independent calibration, instrumental drift

Copyright

This work is licensed under a Creative Commons Attribution 4.0 International License. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/

References

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